(Penn State) To further shrink electronic devices and to lower energy consumption, the semiconductor industry is interested in using 2D materials, but manufacturers need a quick and accurate method for detecting defects in these materials to determine if the material is suitable for device manufacture. Now a team of researchers has developed a technique to quickly and sensitively characterize defects in 2D materials.

Original source: https://www.eurekalert.org/pub_releases/2020-01/ps-mdd012720.php