(Lehigh University) The Lehigh Microscopy School is an annual weeklong program that keeps professionals abreast of developments in scanning electron microscopy. The school’s 2020 session (May 31 to June 5, Lehigh University, Bethlehem, PA) includes courses such as Scanning Electron Microscopy and Microanalysis, Transmission Electron Microscopy, Quantitative X-ray Microanalysis, and Focused Ion Beam Instrumentation and Applications. All courses include a lab component where small groups of students can experience practical applications of the lecture topics.

Original source: https://www.eurekalert.org/pub_releases/2020-01/lu-ahc012920.php